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Message ID: 2355     Entry time: Wed May 29 08:16:47 2019
Author: Anjali 
Type: Update 
Category: 2micronLasers 
Subject: Frequency noise measurement of 2 micron source using PLL 

Attachment #1 shows the oscilloscope traces at different gain values when the actuation slope is 100 kHz/V. It also shows the base line when there is no input to the oscilloscope. Even in the absence of any signal to the oscilloscope, there is an offset with mean value, RMS value and peak to peak value respectively of 35 mV, 42 mV and 200 mV.

Table below summarises the mean value, RMS value and peak to peak value for different combinations of actuation slope and gain.

Actuation slope (kHz/V) Gain Mean value (mV) RMS value (mV) Peak-peak (V)
10  1 -22.5 44 0.3
10 2 -33 74  
10 5 -70 205 1.52
30 1 2.7 33 0.26
30 2 -3.8 71 0.52
30 5 -85 189 1.08
100 1 42 67 0.42
100 2 -32 88 0.6
100 5 -65 207 1.36

The RMS value and the peak to peak value is increasing with increase in gain and the mean value is not showing any trend. I was pressing the Run/stop button before saving the data. I press the same to make the trace alive after saving the data as well. But the mean value read out from the oscilloscope shows different /random values in either case. If I don’t save the data, but only increases the gain, the mean value readout from oscilloscope shows almost the same.

I saw the beat note on the oscilloscope and I was trying to find the change in frequency. The frequency readout from oscilloscope was showing very large fluctuation (60-100 MHz). I feel its not a reliable measurement, but I don’t know whether we have an option to measure the frequency jitter in this oscilloscope (TDS 3032).

Attachment 1: oscilloscope_trace_s_100kHz.zip  168 kB
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