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Full | Summary | Threaded | Collapse | Expand     -- All entries -- Last day Last 3 Days Last week Last month Last 3 Months Last 6 Months Last Year -- Type -- General Facility Clean Supply Mechanics Optics Electronics  432 Entries

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Sun Mar 13 21:22:27 2016, Koji, Electronics, Characterization, Dark current measurement of the HQE PD and other PDs    Sun Mar 13 22:02:09 2016, Koji, Optics, Characterization, HQEPD QE measurement (direct comaprison)    Sat Mar 26 01:49:48 2016, Koji, Optics, Characterization, HQEPD QE    Sat Mar 26 17:39:50 2016, Koji, Electronics, Characterization, HQEPD dark noise        Sat Mar 26 18:22:24 2016, Koji, Electronics, Characterization, Baking / Contamination tests of the PDs        Tue Apr 5 18:22:40 2016, Koji, Electronics, Characterization, Baking / Contamination tests of the PDs        Tue Apr 5 21:20:15 2016, Koji, Electronics, Characterization, More dark noise measurement    Tue Aug 23 23:36:54 2016, Koji, Optics, Characterization, Inspection of the damaged CM1 (prev H1OMC) 7x       Thu Aug 25 02:17:09 2016, Koji, Optics, Characterization, Inspection of the damaged CM1 (prev H1OMC)    Tue Mar 28 21:04:27 2017, Koji, Electronics, Characterization, PDH amp 6x       Sat Jul 29 18:44:38 2017, rana, Electronics, Characterization, PDH amp        Sat Jul 29 21:42:51 2017, Koji, Electronics, Characterization, PDH amp    Thu Feb 22 20:21:02 2018, Koji, Optics, Characterization, aLIGO EOM test        Mon Apr 2 17:27:04 2018, Koji, Optics, Characterization, aLIGO EOM test    Wed May 30 16:40:38 2018, Koji, Mechanics, Characterization, EOM mount stability test    Wed May 30 17:44:23 2018, Koji, Optics, Characterization, 3IFO EOM surface check    Mon Jul 2 11:30:22 2018, Koji, Electronics, Characterization, 3IFO EOM impedance measurement    Mon Jul 2 12:29:01 2018, Koji, Electronics, Characterization, Impedances of individual components (3IFO EOM)    Tue Jul 3 12:07:47 2018, Rich Abbott, Electronics, Characterization, Notes on 3rd IFO EOM        Wed Jul 4 18:30:51 2018, Koji, Electronics, Characterization, EOM circuit models    Thu Jul 26 20:57:07 2018, Koji, Electronics, Characterization, 9MHz port tuned impedance    Tue Aug 7 15:43:12 2018, Koji, Electronics, Characterization, New LLO EOM stuffed    Wed Aug 8 17:32:56 2018, Rich Abbott, General, Characterization, Modulation Index Test Setup at 40m Lab        Thu Aug 9 11:24:29 2018, Koji, General, Characterization, Modulation Index Test Setup at 40m Lab    Thu Jan 10 20:42:54 2019, Koji, Optics, Characterization, FSR / HOM Test of OMC SN002    Thu Jan 10 20:45:00 2019, Koji, Optics, Characterization, PZT test cable    Sat Jan 12 22:49:11 2019, Koji, Optics, Characterization, PM-SM patch cable mode cleaning effect    Sat Feb 2 16:17:13 2019, Koji, Optics, Characterization, Summary: OMC(001) HOM structure recalculation    Sat Feb 2 20:03:19 2019, Koji, Optics, Characterization, Summary: OMC(002) HOM structure recalculation (before mirror replacement)    Sat Feb 2 20:28:21 2019, Koji, Optics, Characterization, Summary: OMC(003) HOM structure recalculation    Sat Feb 2 20:35:02 2019, Koji, Optics, Characterization, Summary: OMC(002) HOM structure recalculation (after mirror replacement)     Tue Mar 19 17:30:25 2019, Koji, General, Characterization, OMC (002) Test items    Thu Mar 28 16:36:52 2019, Koji, Mechanics, Characterization, OMC(002) PZT characterization     Fri Apr 5 01:07:18 2019, Koji, Optics, Characterization, OMC(002): transmitted beam images    Fri Apr 5 01:08:17 2019, Koji, Optics, Characterization, OMC(002): DCPD / QPD alignment    Fri Apr 5 20:50:54 2019, Koji, Optics, Characterization, OMC(002): QPD alignment    Mon Apr 15 21:11:49 2019, Philip, Optics, Characterization, OMC(004): PZT testing for spare OMC        Tue Apr 16 11:36:36 2019, Koji, Optics, Characterization, OMC(004): PZT testing for spare OMC 9x       Tue Apr 16 21:16:11 2019, Koji, Optics, Characterization, OMC(004): PZT testing for spare OMC    Sat Apr 20 00:50:12 2019, Koji, Optics, Characterization, OMC(004): Spot positions    Wed Apr 24 13:58:51 2019, Joe, Optics, Characterization, OMC power budget and UV Epoxy Bonding of BS1    Thu Apr 25 15:05:19 2019, Joe, Optics, Characterization, Looking at PZT HOM spacing dependance and thinking about workflow    Wed May 1 15:40:46 2019, Koji, Optics, Characterization, OMC(004): Spot positions and the scattering        Fri May 3 11:06:28 2019, Koji, Optics, Characterization, OMC(004): Spot positions and the scattering    Thu May 9 18:10:24 2019, Koji, Optics, Characterization, OMC(004): Spot position scan / power budget    Thu May 23 01:42:46 2019, Koji, Optics, Characterization, C30665 high power test    Thu May 23 23:27:38 2019, Koji, Optics, Characterization, IGHQEX3000 high power test    Mon Jul 1 12:38:49 2019, Koji, Optics, Characterization, A and M prisms perpendicularity measurement 6x   Mon Jul 1 12:49:42 2019, Koji, Optics, Characterization, Scattering measurement of A and C mirrors        Thu Aug 22 12:35:53 2019, Stephen, Optics, Characterization, Wedging of the debonded PZTs 2019 August

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