Here are some corner plots to analyze the sensitivity of the designs in the previous elog to a 1% gaussian distributed perturbation using MCMC.

Attachment #1 shows the ETM corner plot 

Attachment #2 shows the ITM corner plot.

I let the indices of both high and low index materials vary, as well as the physical thicknesses and project their covariances to the transmission for PSL and AUX wavelengths.

The result shows that for our designs it is better to undershoot in the optimization stage rather than meet the exact number. Nevertheless, 1% level perturbations in the optical thickness of the stack result in 30% deviations in our target transmission specifications. It would be nice to have a better constraint on how much each parameter is actually varying by, e.g. I don't believe we can't fix the index of refraction to better than 1%., but exactly what its value is I don't know, and what are the layer deposition tolerances? These numbers will make our perturbation analysis more precise.