40m QIL Cryo_Lab CTN SUS_Lab TCS_Lab OMC_Lab CRIME_Lab FEA ENG_Labs OptContFac Mariner WBEEShop
  Mariner elog  Not logged in ELOG logo
Entry  Thu Mar 4 17:04:52 2021, Paco, General, Design specs, Silicon TM dichroic coatings for phase I ETM_coating_candidates.pdfITM_coating_candidates.pdf
    Reply  Wed Mar 17 19:51:42 2021, Paco, General, Design specs, Silicon TM dichroic coatings for phase I ETM_R_210317_1927.pdfETM_Layers_210317_1927.pdfETM_nominal_cornerPlt.pdf
       Reply  Wed Mar 17 21:24:27 2021, gautam, General, Design specs, Silicon TM dichroic coatings for phase I 
          Reply  Wed Mar 24 17:36:46 2021, Paco, General, Design specs, Least common multiple stacks and varL cost ETM_Layers_210323_0925.pdf
             Reply  Fri Apr 2 19:59:53 2021, Paco, General, Design specs, Differential evolution strategies diffevostrategies.pdf
                Reply  Fri Jun 4 11:09:27 2021, Paco, General, Design specs, HR coating tolerance analysis 
          Reply  Wed Mar 24 17:42:50 2021, Paco, General, Design specs, Silicon TM dichroic coatings for phase I 
Message ID: 15     Entry time: Fri Jun 4 11:09:27 2021     In reply to: 10
Author: Paco 
Type: General 
Category: Design specs 
Subject: HR coating tolerance analysis 

The HR coating specifications are:

ETM Transmission specs
2128.2 nm 5.0 ppm \pm 2 ppm
1418.8 nm 50.0 ppm \pm 2 ppm

 

ITM Transmission specs
2128.2 nm 2000.0 ppm \pm 200 ppm
1418.8 nm 50.0 ppm \pm 2 ppm

Analysis

  • Main constraint: Relative arm finesses @ 2128.2 nm should not differ by > 1%.
  • Secondary constraint: Relative arm finesses @ 1418.8 nm may differ, but the ETM and ITM pair should ensure critically coupled cavity to benefit ALS calibration PD shot noise.

Just took the finesse of a single arm:

\mathcal{F} = \frac{\pi \sqrt{r_1 r_2}}{1 - r_1 r_2}

and propagated transmissivities as uncorrelated variables to estimate the maximum relative finesse. Different tolerance combinations give the same finesse tolerance, so multiple solutions are possible. I simply chose to distribute the relative tolerance in T for the test masses homogeneously to simultaneously maximize the individual tolerances and minimize the joint tolerance.

A code snippet with the numerical analysis may be found here.


Tue Jun 8 11:52:44 2021 Update

The arm cavity finesse at 2128 nm will be mostly limited by the T = 2000 ppm of the ITM, so the finesse changes mostly due to this specification. Assuming that the vendor will be able to do the two ETM optics in one run (x and y), we really don't care so much about the mean value achieved in this run as much as the relative one. Therefore, the 200 ppm tolerance (10% level) is allowed at the absolute level, but a 20 ppm tolerance (1% level) is still preferred at the relative level; is this achievable?. Furthermore, for the AUX wavelength, we mostly care about achieving critical coupling but there is no requirement between the arms. Here a 20 ppm tolerance at the absolute level should be ok, but a 2 ppm tolerance between runs is highly desirable (although it seems crazier); is this achievable?

ELOG V3.1.3-