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Message ID: 55     Entry time: Fri Jul 12 00:09:17 2013
Author: Emory Brown 
Type: Optics 
Category: General 
Subject: Analysis of substrate Brownian noise in a silicon test mass with changing ratioR value 

 I performed the same analysis we previously did on a test mass made of silicon (using the built-in silicon within COMSOL) and obtained the attached plots.  The plots show more of a difference between the two solutions optimal points than for fused silica, but they are still quite close.  All data is included in the attached tarball.  The values for ratioR=1 or a cylindrical test mass place the frequency of the lowest real eigenmode at 8491 Hz and the Umax value of  6.5484*10^-11 J.

Attachment 1: SiliconEigenfrequencyPlot.png  13 kB  Uploaded Thu Jul 11 18:17:46 2013  | Hide | Hide all
Attachment 2: UmaxPlotSilicon.png  14 kB  Uploaded Thu Jul 11 18:18:26 2013  | Hide | Hide all
Attachment 3: Silicon.tar.gz  39.610 MB
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