I used optimization codes for ETM. The optimization reduce the PSD of Brownian noise by ~ 3/4 (in units of [m^2/Hz]) from QWL structure.
Since we have not had all the material parameters for aSi:H at 120K with 1550nm, the optimization here is for room temperature with 1550 nm (for Brownian noise only).
fig1: optical thickness for ETM with minimized BR noise. The transmission is 5.4 ppm and the reflected phase is ~ 179 degree.
Parameters/configuration used in the optimization:
- T = 300 K (room temp)
- wavelength = 1550 nm;
- Si substrate, n = 3.5;
- Low index material : fused silica, loss = 0.4e-4, n = 1.444;
- High index material: aSi:H, loss = 1e-6, n = 3.48;
- The coating has SiO2 cap (air-coating surface) for protection
- Spot radius = 6 cm.
** This optimization is only for Brownian noise,** we can do another optimization once the thermo-optical properties are known (thermal expansion, dn/dT)
It is remarkable that 5ppm transmission can be achieved with just 17 layers of coatings due to the largely different values between nL and nH. This makes the total thickness down to ~ 3 um.
**BR noise from the optimized coating is 3.3x 10^-42 [m^2/Hz] at 100 Hz. This is converted to the strain of ~ 5x10^-25 [1/sqrt Hz] for 4 km interferometer. **
Note: for QWL structure, with 14 layers + half wave cap of SiO2 (total of 15 layers), the transmission is ~5.2 ppm and the coating Brownian noise is 4.2x10^-42 [m^2 /Hz]. So the optimization reduced the PSD of BR noise by ~ 25%. |