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If that's true, then it means that a 1% deviation in the index of refraction of the low index material can by a 10x increase in the TO noise. Is this really true?
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That surprises me too, but, that's what the calculation gives me. It is also strange that deviation in nH has smaller effect on to TO noise than nL does. I'm checking it. I ran the code one more time, and still got the same result.
Note: when I calculate the error in refractive indices, I assume that the physical thickness is constant = x * lambda/ n_0. Where x is the optical thicknesss. But if the the actual refractive index is not n_0, it means the optical length is not x, but x*n/n_0. I think this is a valid assumption, if they control the physical thickness during the manufacturing process.
update:Tue Sep 24 02:09:28 2013
The TO noise level does really change a lot when nL is nL + sigma (nL=3.0+ 0.03), dark green trace. Most of the change comes from TR noise level (not shown in the plot). TE noise remains about the same level. It might be worth a try to find another optimization that is less sensitive to the change in value of n. I'll spend sometime working on it. |