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Entry  Mon May 20 19:53:17 2019, Koji, Optics, Configuration, DCPD high power test BIAS.pdfP_20190520_204822.jpg
    Reply  Wed May 22 07:31:37 2019, Koji, Optics, Configuration, Camera test (DCPD high power test) 20190521201838_IMG_7939_2.jpg
Message ID: 363     Entry time: Mon May 20 19:53:17 2019     Reply to this: 364
Author: Koji 
Type: Optics 
Category: Configuration 
Subject: DCPD high power test 

We want to perform a damage test of OMC DCPDs with high power beam. The OMC DCPD is the 3mm InGaAs photodiodes with high quantum efficiency, delivered by Laser Components.
The sites want to know the allowed input power during the OMC scan for beam mode analysis. The nominal bias voltage of the PDs is +12V. Therefore, 30mA of photocurrent with the transimpedance of 400 Ohm is already enough to saturate the circuit. This means that the test is intended to check the damage of the photodiode mainly by the optical power.

The test procedure is as follows:

1. Illuminate the diode with certain optical power.
2. Measure the dark current and dark noise of the PD with no light on it.
3. Check the condition of the PD surface with a digital camera.
4. Repeat 1~3 with larger optical power.

The beam from an NPRO laser is delivered to the photodiode. The maximum power available is 300~400mW. The beam shape was regulated to have the beam radius of ~500um.

- When the PD is exposed to the high power beam, the circuit setup A) is used. This setup is intended to mimic the bias and transimpedance configuration used in the DCPD amp at the site.

- When the dark noise is measured, the circuit setup B) is used. This setup is low noise enough to measure the dark noise (and current) of the PD.

- The test procedure is going to be tested with an Excelitas 3mm InGaAs PD (C30665), and then tested with the high QE PD.

Attachment 1: BIAS.pdf  31 kB  Uploaded Mon May 20 21:03:01 2019  | Hide | Hide all
Attachment 2: P_20190520_204822.jpg  447 kB  Uploaded Wed May 22 08:31:10 2019  | Hide | Hide all
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