I measured electronics noise of WFSs and QPD (of the WFS/QPD, whitening, ADC...) by closing PSL and measuring the error signal. It was needed to put the offset in C1:IOO-MC_TRANS_SUMFILT_OFFSET to 14000 cts (without offset the sum of quadrants would give zero, and 14000 cts is the value when the cavity is locked). For WFS that are RF, if there is intensity noise at low frequencies, it is not affecting the measurement.

In the attachment please find the power spectrum of the error signal when the PSL shutter is on and off.